Citation
Dan Holcomb. "Design as You See FIT: System-Level Soft Error Analysis of Sequential Circuits". Talk or presentation, 31, March, 2009.

Abstract
Design as You See FIT: System-Level Soft Error Analysis of Sequential Circuits Abstract: Soft errors in combinational and sequential elements of dig- ital circuits are an increasing concern as a result of technol- ogy scaling. Several techniques exist for gate and latch harden- ing to synthesize circuits that are tolerant to soft errors. However, each such technique has associated overheads of power, area, and performance. In this work, we present a new methodology to compute the failures intime (FIT) rate of a sequential circuit where the failures are at the system-level. System-level failures are detected by monitors derived from functional specifcations. Our approach includes efficient methods to compute the FIT rate of combinational circuits (CFIT), incorporating effects of logical, timing, and electrical masking. The contribution of circuit components to the FIT rate of the overall circuit can be computed from the CFIT and probabilities of system-level failure due to soft errors in those elements. Designers can use this information to perform Pareto-optimal hardening of selected sequential and combinational components against soft errors. We present ex- perimental results demonstrating that our analysis is efficient, accurate, and provides data that can be used to synthesize a low-overhead, low-FIT sequential circuit.

Electronic downloads

• date_vger_slides.pdf · application/pdf · 3045 kbytes

• HTML

  Dan Holcomb. <a
  href="http://chess.eecs.berkeley.edu/pubs/580.html"
  ><i>Design as You See FIT: System-Level Soft Error
  Analysis of Sequential Circuits</i></a>, Talk or
  presentation,  31, March, 2009.

• Plain text

  Dan Holcomb. "Design as You See FIT: System-Level Soft
  Error Analysis of Sequential Circuits". Talk or
  presentation,  31, March, 2009.

• BibTeX

  @presentation{Holcomb09_DesignAsYouSeeFITSystemLevelSoftErrorAnalysisOfSequential,
      author = {Dan Holcomb},
      title = {Design as You See FIT: System-Level Soft Error
                Analysis of Sequential Circuits},
      day = {31},
      month = {March},
      year = {2009},
      abstract = {Design as You See FIT: System-Level Soft Error
                Analysis of Sequential Circuits Abstract: Soft
                errors in combinational and sequential elements of
                dig- ital circuits are an increasing concern as a
                result of technol- ogy scaling. Several techniques
                exist for gate and latch harden- ing to synthesize
                circuits that are tolerant to soft errors.
                However, each such technique has associated
                overheads of power, area, and performance. In this
                work, we present a new methodology to compute the
                failures intime (FIT) rate of a sequential circuit
                where the failures are at the system-level.
                System-level failures are detected by monitors
                derived from functional specifcations. Our
                approach includes efficient methods to compute the
                FIT rate of combinational circuits (CFIT),
                incorporating effects of logical, timing, and
                electrical masking. The contribution of circuit
                components to the FIT rate of the overall circuit
                can be computed from the CFIT and probabilities of
                system-level failure due to soft errors in those
                elements. Designers can use this information to
                perform Pareto-optimal hardening of selected
                sequential and combinational components against
                soft errors. We present ex- perimental results
                demonstrating that our analysis is efficient,
                accurate, and provides data that can be used to
                synthesize a low-overhead, low-FIT sequential
                circuit. },
      URL = {http://chess.eecs.berkeley.edu/pubs/580.html}
  }
  

Posted by Hiren Patel on 27 Apr 2009.
Groups: chess
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