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Dr. Vishwani D. AgrawalVishwani D. Agrawal is a Distinguished Member of Technical Staff at Bell Labs, Murray Hill, New Jersey, USA, and a Visiting Professor at Rutgers University, New Brunswick, New Jersey, USA. He received a BSc degree from Allahabad University, Allahabad, India, in 1960, BE degree from University of Roorkee, Roorkee, India, in 1964, ME degree from the Indian Institute of Science, Bangalore, India, in 1966, and a PhD degree from the University of Illinois at Urbana-Champaign in 1971. In 1986, he was elected an IEEE Fellow for his contributions to ``probabilistic testing of integrated circuits.'' In 1993, University of Illinois honored him with their Distinguished Alumnus Award. In 1998, he received the Harry H. Goode Award of the IEEE Computer Society for ``innovative contributions to the field of electronic testing.'' He has published 250 papers and five books, and has received five best paper awards. His recent text-book, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, co-authored with M. L. Bushnell has been published in November 2000. He holds thirteen U.S. patents. He has co-directed 12 PhD theses at major universities. In 1991 he co-founded the International Conference on VLSI Design. He is a former editor-in-chief (1985-87) of the IEEE Design & Test of Computers and the founding editor-in- chief (since 1990) of the Journal of Electronic Testing: Theory and Applications. He was the program chair for the Fourth IEEE Asian Test Symposium. He serves on the ECE Alumni Board of the University of Illinois and the ECE Advisory Board of the New Jersey Institute of Technology. Email address: va@research.bell-labs.com
Homepage: http://cm.bell-labs.com/cm/cs/who/va
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